The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Sep. 30, 2016
Disney Enterprises, Inc., Burbank, CA (US);
Changil Kim, Zürich, CH;
Olga Sorkine-Hornung, Zürich, CH;
Christopher Schroers, Zürich, CH;
Henning Zimmer, Zürich, CH;
Katja Wolff, Zürich, CH;
Mario Botsch, Bielefeld, DE;
Alexander Sorkine-Hornung, Zürich, CH;
DISNEY ENTERPRISES, INC., Burbank, CA (US);
ETH ZÜRICH (EIDGENÖSSISCHE TECHNISCHE HOCHSCHULE ZÜRICH), Zürich, CH;
Abstract
Enhanced removing of noise and outliers from one or more point sets generated by image-based 3D reconstruction techniques is provided. In accordance with the disclosure, input images and corresponding depth maps can be used to remove pixels that are geometrically and/or photometrically inconsistent with the colored surface implied by the input images. This allows standard surface reconstruction methods (such as Poisson surface reconstruction) to perform less smoothing and thus achieve higher quality surfaces with more features. In some implementations, the enhanced point-cloud noise removal in accordance with the disclosure can include computing per-view depth maps, and detecting and removing noisy points and outliers from each per-view point cloud by checking if points are consistent with the surface implied by the other input views.