The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Apr. 11, 2016
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Feng Zhou, Sunnyvale, CA (US);
Yuanqing Lin, Sunnyvale, CA (US);
Assignee:
NEC Corporation, , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/66 (2006.01); G06T 7/00 (2017.01); G06N 3/08 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/66 (2013.01); G06K 9/469 (2013.01); G06K 9/627 (2013.01); G06K 9/6267 (2013.01); G06N 3/084 (2013.01); G06T 7/0004 (2013.01); G06T 2207/30128 (2013.01);
Abstract
Systems and methods are disclosed for deep learning and classifying images of objects by receiving images of objects for training or classification of the objects; producing fine-grained labels of the objects; providing object images to a multi-class convolutional neural network (CNN) having a softmax layer and a final fully connected layer to explicitly model bipartite-graph labels (BGLs); and optimizing the CNN with global back-propagation.