The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Jun. 03, 2016
Applicant:
Siemens Healthcare Gmbh, Erlangen, DE;
Inventors:
Xiaoguang Lu, West Windsor, NJ (US);
Vibhas Deshpande, Austin, TX (US);
Peter Kollasch, Minnetonka, MN (US);
Dingxin Wang, Apple Valley, MN (US);
Puneet Sharma, Monmouth Junction, NJ (US);
Assignee:
Siemens Healthcare GmbH, Erlangen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); A61B 5/055 (2006.01); A61B 5/00 (2006.01); A61B 6/03 (2006.01); A61B 8/00 (2006.01); G06N 99/00 (2010.01); G06T 7/00 (2017.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6265 (2013.01); A61B 5/055 (2013.01); A61B 5/4585 (2013.01); A61B 6/032 (2013.01); A61B 6/037 (2013.01); A61B 8/58 (2013.01); G01R 33/543 (2013.01); G06N 99/005 (2013.01); G06T 7/0014 (2013.01); G06T 2207/30048 (2013.01); G06T 2207/30101 (2013.01);
Abstract
Systems and methods for determining optimized imaging parameters for imaging a patient include learning a model of a relationship between known imaging parameters and a quality measure, the known imaging parameters and the quality measure being determined from training data. Optimized imaging parameters are determined by optimizing the quality measure using the learned model. Images of the patient are acquired using the optimized imaging parameters.