The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Sep. 06, 2016
Applicant:

Uneo Incorporated, Taipei, TW;

Inventors:

Yann-Cherng Chern, New Taipei, TW;

Han-Ying Lei, New Taipei, TW;

Chih-Sheng Hou, Taipei, TW;

Chia-Hung Chou, New Taipei, TW;

Assignee:

Uneo Incorporated, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0416 (2013.01); G06F 3/044 (2013.01); G06F 3/0412 (2013.01); G06F 3/0414 (2013.01); G06F 2203/04101 (2013.01);
Abstract

A force sensing structure and a force sensing device including the same are provided. The force sensing structure is configured to detect a proximity of an object to the force sensor from an upside and a force applied by the object to the force touch sensor. The force sensing structure includes a first electrode and a first capacitance material layer. The first capacitance material layer is disposed adjacent to the first electrode. When the object approaches the force touch sensor, the force touch sensor is configured to detect the proximity of the object according to a first capacitance variation, and when the object contacts the force sensor and deforms of the first capacitance material layer, the force touch sensor is configured to detect the force applied by the object according to a second capacitance variation.


Find Patent Forward Citations

Loading…