The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Sep. 29, 2015
Applicant:
Delta Electronics, Inc., Taoyuan Hsien, Taiwan, CN;
Inventors:
Assignee:
DELTA ELECTRONICS, INC., Taoyuan Hsien, Taiwan, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 31/26 (2014.01); G06F 1/26 (2006.01); G01R 31/40 (2014.01); G06F 1/28 (2006.01); G01R 19/165 (2006.01);
U.S. Cl.
CPC ...
G06F 1/26 (2013.01); G01R 31/40 (2013.01); G06F 1/28 (2013.01); G01R 19/16552 (2013.01);
Abstract
The present disclosure generally relates to a test method and system thereof. The test method comprises: outputting a test control signal to a test power supply of the circuit under test so as to adjust an input signal of the circuit under test so that a gain range of the circuit under test in an abnormal operating state is the same as that of the circuit under test in a normal operating state when the circuit under test enters into the abnormal operating state. The present disclosure may meet requirements for equipment test without sacrificing the efficiency of circuits in normal operating state or adding complexity circuit.