The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Feb. 13, 2015
Applicant:

Asahi Glass Company, Limited, Tokyo, JP;

Inventor:

Mitsuyuki Tatemura, Shizuoka-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/28 (2006.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
G02B 5/282 (2013.01); G02B 5/208 (2013.01); G02B 5/283 (2013.01);
Abstract

A near-infrared cut filter has an optical multilayer provided on at least one main surface of a transparent substrate, in which the optical multilayer is formed of a high-refractive index layer having a refractive index of 2.0 or more, and a low-refractive index layer having a refractive index of 1.6 or less at a wavelength of 500 nm, and the optical multilayer has a repeating structure of (aQ, bQ, cQ, dQ)^n when a QWOT at the wavelength of 500 nm of the high-refractive index layer is set to Q, and a QWOT at the wavelength of 500 nm of the low-refractive index layer is set to Q, in which an average value of the ais not less than 1.5 nor more than 2.5, and a value obtained by averaging average values of the respective b, c, and dis 1.0 or less.


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