The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
May. 23, 2012
Applicant:
Shinji Kurokawa, Tokyo, JP;
Inventor:
Shinji Kurokawa, Tokyo, JP;
Assignee:
HITACHI, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01); G01R 33/58 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56 (2013.01); G01R 33/543 (2013.01); G01R 33/5617 (2013.01); G01R 33/583 (2013.01);
Abstract
In order to maximize the SNR of an image in consideration of signal correction in a multi-echo sequence, flip angles of a plurality of refocus high frequency magnetic field pulses are determined in a multi-echo imaging sequence. Using an index that reflects the SNR of an image after signal correction of a plurality of acquired echo signals, a flip angle at which the SNR of the image becomes a maximum is determined by repeatedly calculating the index by changing information specifying the flip angle of each refocus RF pulse according to an optimization method set in advance.