The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Feb. 19, 2016
Applicant:

Andrew Wang, San Diego, CA (US);

Inventor:

Andrew Wang, San Diego, CA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/558 (2006.01); G01N 33/543 (2006.01); G01N 21/78 (2006.01); G01N 21/84 (2006.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
G01N 33/558 (2013.01); G01N 21/78 (2013.01); G01N 21/8483 (2013.01); G01N 33/54366 (2013.01); G01N 2021/7759 (2013.01);
Abstract

A lateral flow assay device that is defined by multiple loading zones, wherein a sample pad is located before and upstream from a conjugate pad and another sample pad is located after and downstream from the conjugate pad. This configuration allows for increased sensitivity for detecting an analyte in a specimen. The device may employ multiple collection pads or a single collection pad and the collection pads may be engaged with the sample pads in several manners, including but not limited to, pressing down on a cassette with collection pads onto a cassette with the test strips, or by sliding the collection pads along the cassette with the test strips and sample pads.


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