The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
May. 01, 2015
Johnson Matthey Public Limited Company, London, GB;
Paul David Featonby, Northumberland, GB;
Emanuele Ronchi, Cleveland, GB;
Johnson Matthey Public Limited Company, London, GB;
Abstract
An apparatus and method for scanning a structure for detecting variations in density of a structure, the apparatus () includes: a source of radiation (); a plurality of detectors (), arranged for receiving radiation emitted by the source along a plurality of respective paths (); the apparatus configured such that, a structure () to be scanned is positionable between the detectors and the source; collimation elements () including a plurality of collimator channels (), each located between a respective detector and the source; and collimation adjustment element (). The apparatus, in a first configuration, provides a first resolution (r) in an axial direction substantially orthogonal to a plane including the source and plurality of paths; and, in a second configuration, the collimation adjustment element is positioned between the collimation elements and the source such that the apparatus provides a second resolution (r) in the axial direction; wherein r<r