The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Jun. 16, 2014
Applicant:

Halliburton Energy Services, Inc., Houston, TX (US);

Inventors:

Hua Xia, Huffman, TX (US);

David L. Perkins, The Woodlands, TX (US);

John L. Maida, Houston, TX (US);

Sean Gregory Thomas, Frisco, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/08 (2006.01); E21B 47/12 (2012.01); G01B 11/16 (2006.01); G01M 11/00 (2006.01); E21B 47/00 (2012.01); G01V 8/10 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01M 11/086 (2013.01); E21B 47/00 (2013.01); E21B 47/123 (2013.01); G01B 11/16 (2013.01); G01M 11/083 (2013.01); G01M 11/31 (2013.01); G01V 8/10 (2013.01); G01N 2021/9511 (2013.01);
Abstract

In some embodiments, a distributed nondestructive inspection method for slickline cable structural defect detection transmits a light pulse along an optical waveguide in the slickline cable. A reflected light signal is 5 received from the optical waveguide in response to the light pulse. Defects can then be determined in the slickline cable based on variations in scattering intensity, phase shift, specific spectral signature, power spectral density, strain amplitude, and/or transmission loss of the reflected light signal as compared to the light pulse.


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