The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Dec. 23, 2016
Biotek Instruments, Inc., Winooski, VT (US);
Oleg Zimenkov, South Burlington, VT (US);
Xavier Amouretti, Essex Junction, VT (US);
Michael Kontorovich, Colchester, VT (US);
Ben Norris, Monkton, VT (US);
Richard N. Sears, Jericho, VT (US);
Dan J. Venditti, Jr., Colchester, VT (US);
Christopher Many, Highgate, VT (US);
Bill Anderson, Westford, VT (US);
Ben Knight, Burlington, VT (US);
James Piette, Winooski, VT (US);
Ross Piette, Essex, VT (US);
Joe Tobey, Essex, VT (US);
Brian Ferris, Georgia, VT (US);
BIOTEK INSTRUMENTS, INC., Winooski, VT (US);
Abstract
An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.