The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Jul. 11, 2014
Applicant:
Invensense, Incorporated, San Jose, CA (US);
Inventors:
Yuan Zheng, Fremont, CA (US);
Shang-Hung Lin, San Jose, CA (US);
William Kerry Keal, Santa Clara, CA (US);
Assignee:
InvenSense, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G01P 21/00 (2006.01); G01C 17/38 (2006.01); G01D 18/00 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G01R 33/00 (2013.01); G01R 33/0035 (2013.01); G01C 17/38 (2013.01);
Abstract
Systems and methods are disclosed for detecting when a magnetic anomaly may impact the quality of data being output by a magnetometer. A plurality of detection algorithms may be performed in parallel on the sensor data. Further, indication of a anomaly from one or a combination of the detection algorithms may cause the magnetometer data to have a reduced contribution in any sensor fusion operation or may be omitted from a sensor fusion operation as desired.