The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Dec. 23, 2014
Applicant:

Tdk-micronas Gmbh, Freiburg, DE;

Inventors:

Tobias Klocke, Lippstadt, DE;

Yan Bondar, Waldkirch, DE;

Assignee:

TDK-Micronas GmbH, Freiburg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/30 (2006.01); G01D 5/12 (2006.01); G01R 33/00 (2006.01); G01D 5/14 (2006.01);
U.S. Cl.
CPC ...
G01D 5/12 (2013.01); G01B 7/30 (2013.01); G01D 5/145 (2013.01); G01R 33/0011 (2013.01);
Abstract

The invention relates to a device () for measurement of an angle of an axis of rotation (), comprising a magnet () with a magnet surface (), which is pivotally assembled at the axis of rotation (), and further comprising a sensor () for recognition of external magnetic flux lines of the magnet (). According to the invention, the magnet () comprises at least a first magnet section () with a magnetic first orientation () and the magnet () further at least comprises a second magnet section () with a second magnetic orientation (), wherein the first magnetic orientation () is displaced from the second magnetic orientation (), whereby the magnet surface () comprises a different concentration of external magnetic flux lines.


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