The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Jul. 30, 2015
Applicant:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;

Inventor:

Daisuke Abe, Nagoya, JP;

Assignee:

BROTHER KOGYO KABUSHIKI KAISHA, Nagoya-Shi, Aichi-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B26D 5/00 (2006.01); B26D 5/06 (2006.01); B26F 1/38 (2006.01);
U.S. Cl.
CPC ...
B26D 5/005 (2013.01); B26D 5/06 (2013.01); B26F 1/3813 (2013.01); B26D 2005/002 (2013.01);
Abstract

A cutting apparatus includes a cut mechanism configured to cut a workpiece; and a control device configured to: judge whether or not each of plural patterns to be cut by the cut mechanism is a test pattern used for evaluating a cut quality of the workpiece cut by the cut mechanism; determine a cut sequence, the cut sequence indicating a sequence in which the plural patterns are cut from the workpiece by the cut mechanism, the cut sequence being determined so that a pattern judged as the test pattern is cut before a normal pattern judged to not be the test pattern; and control the cut mechanism to cut the plural patterns from the workpiece according to the cut sequence.


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