The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Dec. 08, 2014
Atheer, Inc., Mountain View, CA (US);
Mohamed Nabil Hajj Chehade, Los Angeles, CA (US);
Sina Fateh, Mountain View, CA (US);
Sleiman Itani, East Palo Alto, CA (US);
Allen Yang Yang, Richmond, CA (US);
Atheer, Inc., Mountain View, CA (US);
Abstract
First and second images are captured at first and second focal lengths, the second focal length being longer than the first focal length. Element sets are defined with a first element of the first image and a corresponding second element of the second image. Element sets are identified as background if the second element thereof is more in-focus than or as in-focus as the first element. Background elements are subtracted from further analysis. Comparisons are based on relative focus, e.g. whether image elements are more or less in-focus. Measurement of absolute focus is not necessary, nor is measurement of absolute focus change; images need not be in-focus. More than two images, multiple element sets, and/or multiple categories and relative focus relationships also may be used.