The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Aug. 05, 2014
Applicant:
Oracle International Corporation, Redwood City, CA (US);
Inventors:
Thyagaraju Poola, Sunnyvale, CA (US);
Brent Enck, Roseville, CA (US);
Vladimir Volchegursky, Redwood City, CA (US);
Assignee:
Oracle International Corporation, Redwood Shores, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/02 (2006.01); H04L 29/08 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
H04L 67/10 (2013.01); G06N 7/00 (2013.01);
Abstract
Aspects provide a generic and adaptive approach to adaptive thresholding by using a maximum concentration interval of data to determine one or more adaptive thresholds for any type of operational metric. The generated adaptive thresholds and operational metrics may be used to calculate or otherwise perform a statistical analysis that provides a confidence-level for any changes detected in the operational metric behavior.