The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Jun. 27, 2017
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventors:

Leo Kar Leung Poon, San Jose, CA (US);

David L. Ferguson, Singapore, SG;

Assignee:

XILINX, INC., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/16 (2006.01); H04L 25/49 (2006.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04L 25/4917 (2013.01); H04B 1/16 (2013.01); H04B 17/29 (2015.01);
Abstract

A characterization system includes a signal detector. The signal detector includes a first conversion unit configured to receive, from a first device, a first device output signal including N possible discrete pulse amplitudes and generate a plurality of detected signals based on a plurality of threshold amplitudes respectively. The signal detector further includes a second conversion unit configured to generate a first conversion output signal and a second conversion output signal based on logic values included in the plurality of detected signals and provide first and second conversion output signals to an analysis unit for generating one or more measurements of the first device. The first and second conversion output signals include Mand Mpossible discrete pulse amplitudes respectively. Mand Mare integers less than N.


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