The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Sep. 29, 2015
Ihi Corporation, Koto-ku, JP;
The University of Tokyo, Bunkyo-ku, JP;
Hiroyuki Hishida, Koto-ku, JP;
Koichi Inagaki, Koto-ku, JP;
Takeshi Nakamura, Koto-ku, JP;
Yu Hasegawa, Bunkyo-ku, JP;
Hiromasa Suzuki, Bunkyo-ku, JP;
Takashi Michikawa, Bunkyo-ku, JP;
Yutaka Ohtake, Bunkyo-ku, JP;
Suguru Kondo, Bunkyo-ku, JP;
IHI CORPORATION, Koto-ku, JP;
THE UNIVERSITY OF TOKYO, Bunkyo-ku, JP;
Abstract
An image analysis apparatus, which analyzes orientations of fiber bundles of X-yarns and Y-yarns from a three-dimensional image of a woven fabric made of fiber bundles of the X-yarns, the Y-yarns, and Z-yarns, includes: a binarization unit that binarizes the three-dimensional image; an overlapping area extraction unit that extracts an overlapping area from the binarized image; a reference direction determination unit that averages an overlapping direction of each voxel included in the overlapping area and determines the averaged direction as a reference direction; a Z-yarn removal unit that removes the Z-yarns from the binarized image by applying a directional distance method on a reference plane perpendicular to the reference direction; and a fiber bundle orientation estimation unit that applies the directional distance method on the reference plane and estimates the orientations of the fiber bundles of the X-yarns and the Y-yarns based on a calculated directional distance.