The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Feb. 14, 2018
Applicant:

King Abdullah University of Science and Technology, Thuwal, SA;

Inventors:

Daliang Zhang, Thuwal, SA;

Yu Han, Thuwal, SA;

Kun Li, Thuwal, SA;

Yihan Zhu, Thuwal, SA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/37 (2017.01);
U.S. Cl.
CPC ...
G06T 7/37 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20056 (2013.01);
Abstract

A system and method involve receiving a sequence of images of an object with at least two consecutive images of the sequence being spatially shifted relative to each other. Each image is transformed into a Fourier domain using a Fourier transform to generate a corresponding plurality of Fourier transformed images. An amplitude filtered pattern is calculated in the Fourier domain based on amplitude components of the plurality of Fourier transformed images. Spatial shifts for pairs of consecutive images in the sequence of images are determined using the amplitude filtered pattern. Images in the sequence of images are aligned based on the determined spatial shifts and the aligned images are summed to form an image-shift-corrected summed image.


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