The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Dec. 22, 2013
Applicant:

Analogic Corporation, Peabody, MA (US);

Inventors:

John P. O'Connor, Andover, MA (US);

Charles Shaughnessy, Wenham, MA (US);

Eric Zanin, Lexington, MA (US);

Nicholas A. Accomando, Hingham, MA (US);

Assignee:

ANALOGIC CORPORATION, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/46 (2006.01); G06T 3/60 (2006.01); G06T 7/32 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 9/4671 (2013.01); G06T 3/60 (2013.01); G06T 7/0012 (2013.01); G06T 7/32 (2017.01); G06T 2207/10048 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30252 (2013.01);
Abstract

One or more techniques and/or systems are described for inspecting an object, such as a tire. The system comprises a radiation imaging system configured to examine the object via radiation to generate a radiation image depicting an interior aspect of the object and a machine vision system configured to measure visible light and/or infrared wavelengths to generate a vision image depicting an exterior aspect of the object. The radiation image and the vision image may be correlated to facilitate an inspection of the object which includes an inspection of the exterior aspect as well as the interior aspect.


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