The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Jan. 20, 2015
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Paul C. Hershey, Asburn, VA (US);

Thomas P. Deardorff, Spring Mills, PA (US);

David J. Wisniewski, State College, PA (US);

John J. Williams, Dulles, VA (US);

Geoffrey Guisewite, State College, PA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06N 5/04 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 99/005 (2013.01); G06F 17/18 (2013.01);
Abstract

A method of fusing sensor detection probabilities. The fusing of detection probabilities may allow a first force to detect an imminent threat from a second force, with enough time to counter the threat. The detection probabilities may include accuracy probability of one or more sensors and an available time probability of the one or more sensors. The detection probabilities allow a determination of accuracy of intelligence gathered by each of the sensors. Also, the detection probabilities allow a determination of a probable benefit of an additional platform, sensor, or processing method. The detection probabilities allow a system or mission analyst to quickly decompose a problem space and build a detailed analysis of a scenario under different conditions including technology and environmental factors.


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