The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Nov. 11, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Jang-Hyuk An, Yongin-si, KR;

Byoung-Ju Choi, Seoul, KR;

Ji-Hyun Park, Goyang-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0742 (2013.01); G06F 11/0748 (2013.01); G06F 11/3024 (2013.01); G06F 11/34 (2013.01); G06F 11/348 (2013.01); G06F 11/3409 (2013.01); G06F 11/3644 (2013.01);
Abstract

In a method of analyzing a fault and/or error of an electronic system according to some example embodiments, a system call that accesses a hardware is replaced with a hooking system call including a code that executes the system call and a code that obtains monitoring information, the monitoring information including system call execution information and hardware performance information is obtained by executing the hooking system call when the hooking system call is called instead of the system call, and the monitoring information is recorded to analyze the fault/error of the electronic system based on the monitoring information.


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