The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Mar. 24, 2016
Nidek Co., Ltd., Aichi, JP;
Yoshihiro Ozaki, Aichi, JP;
Toru Arikawa, Aichi, JP;
Toshihiro Kobayashi, Aichi, JP;
Yujiro Tochikubo, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
There is an provided eyeglass fitting parameter measurement device including: a display control unit that displays a front image of an examinee wearing an eyeglass frame and a lateral image of the examinee wearing the eyeglass frame on a display part; and a position information detection unit that detects position information for determining the positions of the examinee's eyes or the eyeglass frame based on one of the front image and the lateral image. The display control unit provides a correspondence indication corresponding to the position information detected by the position information detection unit in a display area for the other of the front image and the lateral image based on the position information.