The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Apr. 07, 2016
Nikon Corporation, Tokyo, JP;
Yosuke Okudaira, Konosu, JP;
Hisao Osawa, Kashiwa, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
A structured illumination microscope device includes acquisition unit that repeats a series of processing steps including controlling a combination of a wave vector and phase of fringes and acquiring N images; and computing unit in which processing for demodulating the image of the sample using a required M types of images from an image set of consecutive P images. The M types of images include: Q types (where Q≥3) of modulated images; and one type of modulated image having the wave vector in common with and the phase differing from at least one among the Q types of modulated images, or one unmodulated image. An arrangement of the N images satisfies the uniformity condition, meaning 'intensity distribution of the fringes is spatially uniform when accumulated between the N images' and the refresh condition, meaning 'the M types of images are always included in the image set'.