The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

May. 14, 2015
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Samsung Sdi Co., Ltd., Yongin-si, KR;

Inventors:

Hyung Jun Kim, Suwon-si, KR;

Ji-Hoon Lee, Jeonju-si, KR;

Hye Young Kong, Uijeongbu-si, KR;

Jong Hoon Won, Yongin-si, KR;

Myung Sup Jung, Seongnam-si, KR;

Assignees:

SAMSUNG ELECTRONICS CO., LTD., Gyeonggi-Do, KR;

SAMSUNG SDI CO., LTD., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01); H01L 51/52 (2006.01); G02F 1/13363 (2006.01);
U.S. Cl.
CPC ...
G02B 5/3083 (2013.01); G02F 1/133634 (2013.01); H01L 51/5275 (2013.01); H01L 51/5281 (2013.01); G02F 2001/133637 (2013.01); G02F 2001/133638 (2013.01); Y10T 428/10 (2015.01); Y10T 428/1036 (2015.01);
Abstract

A compensation film includes a first retardation layer comprising a polymer having negative birefringence, and a second retardation layer comprising a polymer having negative birefringence, where the first retardation layer has an in-plane retardation (R) in a range of about 180 nanometers to about 300 nanometers for incident light having a wavelength of about 550 nanometers, the second retardation layer has an in-plane retardation (R) in a range of about 60 nanometers to about 170 nanometers for the incident light having the wavelength of about 550 nanometers, and the entire in-plane retardation (R) of the first retardation layer and the second retardation layer for incident light having wavelengths of about 450 nanometers and about 550 nanometers satisfies the following inequation: R(450 nm)<R(550 nm).


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