The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Dec. 10, 2013
Applicants:

Joseph Dagher, Tucson, AZ (US);

Audrey Fan, Cambridge, MA (US);

Ali Bilgin, Tucson, AZ (US);

Inventors:

Joseph Dagher, Tucson, AZ (US);

Audrey Fan, Cambridge, MA (US);

Ali Bilgin, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/50 (2006.01); G01R 33/56 (2006.01); A61B 5/055 (2006.01); G01R 33/561 (2006.01); G01R 33/565 (2006.01); G01R 33/34 (2006.01); G01R 33/385 (2006.01); G01R 33/48 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); A61B 5/055 (2013.01); G01R 33/34 (2013.01); G01R 33/385 (2013.01); G01R 33/4806 (2013.01); G01R 33/56 (2013.01); G01R 33/5615 (2013.01); G01R 33/56554 (2013.01); A61B 5/7285 (2013.01); G01R 33/5616 (2013.01);
Abstract

Described here are systems and methods for estimating phase measurements obtained using a magnetic resonance imaging (MRI) system such that phase ambiguities in the measurements are significantly mitigated. Echo time spacings are determined by optimizing phase ambiguity functions associated with the echo time spacings. Data is then acquired using a multi-echo pulse sequence that utilizes the determined echo spacings. Phase measurements are then estimated and images are reconstructed using a reconstruction technique that disambiguates the phase ambiguities in the phase measurements.


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