The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Jan. 15, 2016
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Jean Coignus, Grenoble, FR;

Alexandre Vernhet, Saint Martin D'Heres, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/3177 (2006.01); G11C 29/06 (2006.01); G11C 29/12 (2006.01); G11C 29/50 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/2621 (2013.01); G01R 31/2648 (2013.01); G11C 29/06 (2013.01); G11C 29/12015 (2013.01); G11C 29/50004 (2013.01);
Abstract

A system for characterising a NOR flash memory cell provided with a floating gate transistor, includes a voltage generator having an output connected to the gate electrode that generates as output an erase signal; and a dynamic measurement apparatus including a first channel connected to the gate electrode and a second channel connected to the drain electrode. The dynamic measurement apparatus generates on the first and second channels write signals and measures a current flowing in the drain electrode during the writing of the memory cell. Only the gate electrode of the floating gate transistor is connected to the voltage generator and to the dynamic measurement apparatus by a CMOS switch, which switches between a first position, where the output of the voltage generator is electrically coupled to the gate electrode, and a second position, where the first channel of the measurement device is electrically coupled to the gate electrode.


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