The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Aug. 18, 2017
Applicant:
Melexis Technologies N.v., Tessenderlo, BE;
Inventors:
Johan Raman, Knesselare, BE;
Pieter Rombouts, Mariakerke, BE;
Assignee:
MELEXIS TECHNOLOGIES SA, Bevaix, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2015.01); G01R 27/28 (2006.01); G01R 31/00 (2006.01); G01R 31/28 (2006.01); G01L 9/12 (2006.01); G01L 9/06 (2006.01); G01L 9/02 (2006.01); G01L 1/22 (2006.01); G01L 1/14 (2006.01); G01L 9/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/003 (2013.01); G01L 1/144 (2013.01); G01L 1/2262 (2013.01); G01L 9/02 (2013.01); G01L 9/04 (2013.01); G01L 9/06 (2013.01); G01L 9/12 (2013.01); G01R 31/2829 (2013.01);
Abstract
A method for reading out a sensor unit having a first set of nodes and a second set of nodes and a symmetry which allows different configurations of excitation and sensing lead to a same readout. The method includes changing the readout configuration of the sensor unit by exchanging excitation and sensing between the first set of nodes and the second set of nodes, evaluating the similarity or deviation between measurement signals obtained in different readout configurations of the sensor unit, raising an error if the measurement signals differ more from one another than a predetermined value.