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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10067098 B1

PDFFull Text
Date of Patent:
Sep. 04, 2018

Filed:

Jan. 22, 2014

Ultrasonic flaw detection jig, ultrasonic flaw detection method and method of manufacturing ultrasonic flaw detection jig

Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Mitsuyoshi Uematsu, Tokyo, JP;

Yoshiharu Kuze, Tokyo, JP;

Seiji Kobayashi, Tokyo, JP;

Tomohiro Mizuno, Tokyo, JP;

Assignee:

MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;

Attorney:

Kanesaka Berner and Partners LLP

Primary Examiner:

Manish S Shah

Assistant Examiner:

Suman K Nath

Int. Cl.
CPC ...
G01N 29/28 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01N 29/28 (2013.01); G01N 29/221 (2013.01); G01N 29/223 (2013.01); G01N 2291/269 (2013.01); G01N 2291/2636 (2013.01);
Abstract

An ultrasonic flaw detection jig includes a base section with which a probe of the ultrasonic inspection apparatus is brought into contact; and a prominence section provided for the base section and inserted into an inspection object hole of an inspection object. The inspection object hole includes a countersunk section connected with a main surface of the inspection object and extending from the main surface while reducing a diameter; and a connection section connecting a bottom of the countersunk section and the rear surface of the inspection object. The prominence section has a conical shape corresponding to the shape of the countersunk section.

Find Patent Forward Citations

Uematsu, Mitsuyoshi. (2018). Ultrasonic flaw detection jig, ultrasonic flaw detection method and method of manufacturing ultrasonic flaw detection jig (U.S. Patent No. 10067098). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10067098

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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