The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Nov. 13, 2015
The Curators of the University of Missouri, Columbia, MO (US);
Lingyu Chi, Rolla, MO (US);
Ming Huang, Rolla, MO (US);
Rex E. Gerald, II, Rolla, MO (US);
Klaus Woelk, Rolla, MO (US);
The Curators of the University of Missouri, Columbia, MO (US);
Abstract
In situ measuring devices, methods of making the same, and methods of using the same are provided herein. The in situ measuring devices can include a capillary tube having a reference material sealed inside the capillary tube, where the capillary tube is positioned inside of a solid state or MAS NMR rotor. A target sample can also be positioned in the interior of the solid state or MAS NMR rotor but is sequestered from the reference material by a capillary tube wall. The in situ measuring devices can be used in solid state MAS NMR spectroscopy to quantify one or more parameters of a target sample, such as the quantity of a sample, chemical identity of a sample, or temperature of a sample.