The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Sep. 08, 2016
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Danjun Zhao, Shiojiri, JP;
Masanobu Kobayashi, Chino, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01J 3/28 (2006.01); G01J 3/26 (2006.01); G01J 3/51 (2006.01); G01J 3/02 (2006.01); G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2803 (2013.01); G01J 3/027 (2013.01); G01J 3/26 (2013.01); G01J 3/51 (2013.01); G01J 2003/283 (2013.01); G01J 2003/425 (2013.01);
Abstract
A measuring device includes a first light receiving element that receives measurement light and outputs a first output value, and a second light receiving element that receives the measurement light and outputs a second output value which is different from the first output value. A weighted composition is performed on the first output value and the second output value.