The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Jun. 15, 2015
Infibra Technologies S.r.l., Pisa, IT;
Tiziano Nannipieri, Cascina, IT;
Alessandro Signorini, Ponsacco, IT;
Mohammad Taki, Monserrato, IT;
Stefano Faralli, Grosseto, IT;
Fabrizio Di Pasquale, Pisa, IT;
INFIBRA TECHNOLOGIES S.R.L., Pisa, IT;
Abstract
A method for measuring a distributed physical value of an optical device under test (DUT), includes the steps of: launching into the DUT a probe signal that includes a plurality of optical pulses at at least one test wavelength, and receiving at least one optical signal backscattered by the DUT, wherein the optical pulses are obtained with at least the following steps: generating a first time sequence of first pulses that corresponds to a word of a first code, the first time sequence lasting not shorter than a time of flight and being formed by a number of time slots that is equal to the number of bits of the word of the first code; generating a second time sequence of second pulses that corresponds to a word of a second code; and amplitude modulating the second time sequence with the first time sequence.