The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
May. 17, 2017
Adamant Namiki Precision Jewel Co., Ltd., Tokyo, JP;
Hiroshi Yamazaki, Kuroishi, JP;
Eri Fukushima, Kuroishi, JP;
Kazumi Yanagiura, Kuroishi, JP;
Takafumi Asada, Kuroishi, JP;
Adamant Namiki Precision Jewel Co., Ltd., Tokyo, JP;
Abstract
An optical inner-surface measurement device includes: an optical fiber included inside a tube, the optical fiber being configured to be inserted into a hole of an inspection object; at least two optical-path converting elements disposed in a forward-end of the optical fiber; and a motor for rotationally driving at least one of the at least two optical-path converting elements. The at least two optical-path converting elements emit a light beam, guided thereto through the optical fiber, to an inner peripheral surface of the hole of the inspection object three-dimensionally in a circumferential direction and an axial direction of the hole.