The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

May. 22, 2017
Applicant:

Dmg Mori Co., Ltd., Yamato-Koriyama, Nara, JP;

Inventors:

Kenji Matsushita, Isehara, JP;

Yusuke Nakamura, Isehara, JP;

Yasuhito Nomoto, Isehara, JP;

Shun Katoh, Isehara, JP;

Assignee:

DMG MORI CO., LTD., Yamato-Koriyama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01D 5/38 (2006.01); G01B 11/00 (2006.01); G01D 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02061 (2013.01); G01B 9/02038 (2013.01); G01B 11/002 (2013.01); G01D 5/00 (2013.01); G01D 5/38 (2013.01); G01B 2290/30 (2013.01);
Abstract

A displacement detection apparatus can reduce a measurement error even when a diffraction grating is displaced and/or tilted to a direction other than the measurement direction. A displacement detection apparatus includes a light source which emits light, a luminous flux-splitting section, a diffraction grating, a diffracted light-reflecting section, a correcting lens, a luminous flux-coupling section, and a light-receiving section. The diffracted light-reflecting section reflects a first luminous flux and a second luminous flux so as to be perpendicular to one of measuring planes of the diffraction grating and be parallel to each other. The correcting lens is arranged between the diffracted light-reflecting section and the diffraction grating.


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