The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Aug. 12, 2015
Applicant:
Topcon Positioning Systems, Inc., Livermore, CA (US);
Inventors:
Jan Mennink, Livermore, CA (US);
Vernon Joseph Brabec, Livermore, CA (US);
Assignee:
Topcon Positioning Systems, Inc., Livermore, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E01C 23/01 (2006.01); G01B 17/08 (2006.01); G01C 7/04 (2006.01); G01C 15/00 (2006.01); E02F 9/26 (2006.01); E01C 19/00 (2006.01); G01B 21/00 (2006.01); E01C 11/00 (2006.01); E01C 23/07 (2006.01); G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
E01C 23/01 (2013.01); E01C 11/005 (2013.01); E01C 19/00 (2013.01); E01C 19/002 (2013.01); E01C 23/07 (2013.01); E02F 9/262 (2013.01); G01B 11/303 (2013.01); G01B 17/08 (2013.01); G01B 21/00 (2013.01); G01C 7/04 (2013.01); G01C 15/002 (2013.01);
Abstract
A method and apparatus for filtering point cloud data obtained using a plurality of sensors generates data representative of a surface and for use with a specific type of sensor. The filtering allows certain machines and sensor types to be used to acquire point cloud data and different sensor types to be used during surface construction and modification. The method can be utilized with various types of machine controls and surface construction methods.