The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Aug. 29, 2013
Kabushiki Kaisha Dnaform, Yokohama-shi, Kanagawa, JP;
Yoshihide Hayashizaki, Tsukuba, JP;
Masayoshi Itoh, Tokyo, JP;
Takahiro Arakawa, Kawasaki, JP;
Kengo Usui, Yokohama, JP;
Sotaro Uemura, Yokohama, JP;
Yasumasa Mitani, Yokohama, JP;
KABUSHIKI KAISHA DNAFORM, Kanagawa, JP;
Abstract
The present invention is to provide a method for analyzing a target nucleic acid, by which the target nucleic acid can be analyzed rapidly and easily. In order to achieve the above object, the present invention provides a method for analyzing a target nucleic acid in a sample, including the step of: analyzing the target nucleic acid in the sample by bringing the sample into contact with a label and with a primer or probe that can hybridize to the target nucleic acid. The primer or probe is immobilized on a solid phase. The label does not emit light when the primer or probe does not hybridize to the target nucleic acid, whereas the label emits light when the primer or probe has hybridized to the target nucleic acid. The analysis is carried out by detecting the light emitted from the label.