The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Apr. 16, 2012
Applicants:

Kouki Itoyama, Odawara, JP;

Fumio Miyazawa, Gotemba, JP;

Inventors:

Kouki Itoyama, Odawara, JP;

Fumio Miyazawa, Gotemba, JP;

Assignee:

FUJIBO HOLDINGS, INC., Chuo-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 37/24 (2012.01); B24B 37/22 (2012.01); H01L 21/304 (2006.01); C08J 9/12 (2006.01); C08G 18/48 (2006.01); C08G 18/76 (2006.01); C08G 18/10 (2006.01); C08G 101/00 (2006.01);
U.S. Cl.
CPC ...
B24B 37/24 (2013.01); B24B 37/22 (2013.01); C08G 18/10 (2013.01); C08G 18/4854 (2013.01); C08G 18/7621 (2013.01); C08J 9/12 (2013.01); H01L 21/304 (2013.01); C08G 2101/0008 (2013.01); C08J 2207/00 (2013.01); C08J 2375/04 (2013.01);
Abstract

A polishing pad for polishing a semiconductor device and manufacturing method therefor, the polishing pad comprising a polishing layer having a polyurethane-polyurea resin foam containing substantially spherical cells, wherein an M-component of the polyurethane-polyurea resin foam has a spin-spin relaxation time T2 of 160 to 260 μs, the polyurethane-polyurea resin foam has a storage elastic modulus E' of 1 to 30 MPa, the storage elastic modulus E′ being measured at 40° C. with an initial load of 10 g, a strain range of 0.01 to 4%, and a measuring frequency of 0.2 Hz in a tensile mode, and the polyurethane-polyurea resin foam has a density D in a range from 0.30 to 0.60 g/cm. The polishing pad remedies the problem of scratches occurring when a conventional hard (dry) polishing pad is used, which is excellent in polishing rate and polishing uniformity, and can be used for primary polishing or finish polishing.


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