The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Oct. 23, 2013
Nidek Co., Ltd., Gamagori, Aichi, JP;
Ai Yamakawa, Gamagori, JP;
Norimasa Satake, Aichi, JP;
Tetsuya Kano, Toyota, JP;
Hisanori Torii, Gamagori, JP;
NIDEK CO., LTD., Gamagori, Aichi, JP;
Abstract
An ophthalmic analysis apparatus is the ophthalmic analysis apparatus for obtaining analysis results of tomography images of a subject eye acquired at different dates by ophthalmic optical coherence tomography and outputting statistical information formed based on time-series data of the analysis results, and includes instruction receiving means for receiving selection instructions to select an analytical region on a subject eye from an examiner, and control means for respectively acquiring analysis results in the analytical region selected by the instruction receiving means with respect to tomography images acquired at the different dates and outputting the statistical information.