The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Nov. 22, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Taro Kato, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/369 (2011.01); H01L 27/146 (2006.01); H04N 5/225 (2006.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); H01L 27/14627 (2013.01); H04N 5/2254 (2013.01); H04N 5/3696 (2013.01); H04N 5/378 (2013.01);
Abstract

An image pickup apparatus including a focus detection pixel configured to perform focus detection by a phase difference method, is provided. The focus detection pixel comprises a photoelectric conversion unit arranged in a substrate, a microlens arranged above the photoelectric conversion unit, and a light guide arranged between the photoelectric conversion unit and the microlens. A refracting power of the microlens on a first plane is smaller than a refracting power of the microlens on a second plane. The first plane passes through a top of the microlens, is perpendicular to an upper surface of the substrate, and is located along a direction in which the focus detection pixel performs the focus detection. The second plane passes through the top of the microlens, is perpendicular to the upper surface of the substrate, and intersects the first plane.


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