The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Dec. 12, 2016
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Ayumi Fuchida, Tokyo, JP;

Yuichiro Okunuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/125 (2006.01); H01S 5/042 (2006.01); H01S 5/343 (2006.01); H01S 5/20 (2006.01); H01S 5/34 (2006.01); H01S 5/30 (2006.01); H01S 5/32 (2006.01);
U.S. Cl.
CPC ...
H01S 5/125 (2013.01); H01S 5/0425 (2013.01); H01S 5/2022 (2013.01); H01S 5/2027 (2013.01); H01S 5/34313 (2013.01); H01S 5/305 (2013.01); H01S 5/3213 (2013.01); H01S 5/3412 (2013.01); H01S 2301/166 (2013.01);
Abstract

An edge-emitting semiconductor laser includes: a semiconductor substrate; a first cladding layer having a first refractive index and formed on the semiconductor substrate; an active layer formed on the first cladding layer and having a second refractive index higher than the first refractive index; a Bragg reflector formed on the active layer and in which low-refractive-index layers and high-refractive-index layers each having a thickness larger than λ/4n are alternately laid one on another where λ is an lasing wavelength and n is a refractive index of a medium; a light absorption layer formed on the Bragg reflector and having bandgap energy lower than that of the active layer; and a second cladding layer formed on the light absorption layer and having a third refractive index lower than the second refractive index.


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