The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Oct. 15, 2015
Applicant:

Korea Research Institute of Standards and Science, Daejeon, KR;

Inventors:

Ansoon Kim, Daejeon, KR;

Kyung Joong Kim, Daejeon, KR;

Songwoung Hong, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/00 (2006.01); H01L 31/18 (2006.01); H01L 33/00 (2010.01); H01L 33/06 (2010.01); H01L 31/074 (2012.01); H01L 31/0352 (2006.01);
U.S. Cl.
CPC ...
H01L 31/1804 (2013.01); H01L 31/035218 (2013.01); H01L 31/074 (2013.01); H01L 33/0058 (2013.01); H01L 33/06 (2013.01); Y02E 10/50 (2013.01);
Abstract

Provided are a method of manufacturing a quantum-dot photoactive-layer including: alternately depositing an amorphous silicon compound layer and a silicon-rich compound layer containing conductive impurities and an excess of silicon based on a stoichiometric ratio on a silicon substrate to form a composite multi-layer; and heat treating the composite multi-layer to form a plurality of silicon quantum-dots in a matrix corresponding to a silicon compound, wherein an amorphous silicon layer containing the conductive impurities is formed at least one time instead of the silicon-rich compound layer, and a quantum-dot photoactive-layer manufactured using the method as described above.


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Kim, Ansoon. (2018). Quantum-dot photoactive-layer and method for manufacture thereof (U.S. Patent No. 10062799). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10062799

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