The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Sep. 14, 2016
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventor:

Kenji Kouno, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/08 (2006.01); H01L 29/06 (2006.01); H01L 29/32 (2006.01); H01L 29/861 (2006.01); H01L 29/739 (2006.01); H01L 27/07 (2006.01); H01L 29/10 (2006.01); H01L 21/263 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0804 (2013.01); H01L 27/0727 (2013.01); H01L 29/0619 (2013.01); H01L 29/0696 (2013.01); H01L 29/32 (2013.01); H01L 29/7397 (2013.01); H01L 29/861 (2013.01); H01L 21/263 (2013.01); H01L 29/1095 (2013.01);
Abstract

A semiconductor device includes a semiconductor substrate having a drift layer, a base layer, a collector layer and a cathode layer. The semiconductor substrate includes a cell region and an outer peripheral region surrounding the cell region. The cell region includes an IGBT region and a diode region. The semiconductor substrate further includes a damage region arranged in the diode region and a part of the outer peripheral region adjacent to a boundary between the outer peripheral region and the diode region. A length, in a longitudinal direction of the diode region, of the part of the outer peripheral region, in which the damage region is arranged, is equal to or more than twice of a thickness of the semiconductor substrate. As a result, recovery characteristic is improved in a portion of the diode region adjacent to the boundary between the outer peripheral region and the diode region.


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