The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Mar. 18, 2014
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Saigopal Nelaturi, Palo Alto, CA (US);
Walter Kim, San Francisco, CA (US);
Arvind Rangarajan, Santa Clara, CA (US);
Tolga Kurtoglu, San Jose, CA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
A system and a method automate metrology, measurement, and model correction of a three dimensional (3D) model for 3D printability. Slices of the 3D model are received or generated. The slices represent 2D solids of the 3D model to be printed in corresponding print layers. Medial axis transforms of the slices are calculated. The medial axis transforms represent the slices in terms of corresponding medial axes. A local feature size at any point along a boundary of the slices is determined as the shortest distance from the point to a corresponding medial axis.