The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
May. 11, 2015
Informatica Llc, Redwood City, CA (US);
Gregorio Convertino, Sunnyvale, CA (US);
Mark Detweiler, San Francisco, CA (US);
Maoyuan Sun, Blacksburg, VA (US);
Informatica LLC, Redwood City, CA (US);
Abstract
A system and method are disclosed for providing metric recommendations by a cloud event log analytics system. The log analytics system includes a user interface which allows users to view metric recommendations, view, modify, annotate, delete, or create log metrics. In a first embodiment, centroid vectors are created from metadata associated with user access of log metrics. The centroid vectors are compared to metrics vectors created from log metrics and the results are ranked and provided to users as metric recommendations. In a second embodiment, classification rules are inferred for metric matrix tables containing metadata about log metric usage. Classification rules are assigned to a decision tree used to calculate composite probabilities of interest of log metrics. A recommendation matrix incorporate the composite probabilities of interest to predict the degree of interest an analytics user may have in a log metric for a given role.