The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Nov. 16, 2016
Applicant:

Anodot Ltd., Ra'anana, IL;

Inventor:

Meir Toledano, Tel Aviv, IL;

Assignee:

Anodot Ltd., Ra'anana, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/32 (2006.01); G06F 11/34 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3072 (2013.01); G06F 11/079 (2013.01); G06F 11/321 (2013.01); G06F 11/322 (2013.01); G06F 11/327 (2013.01); G06F 11/3428 (2013.01); G06F 11/0721 (2013.01);
Abstract

A processing system receives a time series of values of a first metric corresponding to computing system performance. A computation module calculates an autocorrelation function (ACF) based on the time series of values across a set of values of tau. The spacing between each consecutive pair of values in the set of values of tau increases as tau increases. A local maxima extraction module identifies local maxima of the calculated ACF. A period determination module determines a significant period based on spacing between the local maxima and selectively outputs the significant period as a periodicity profile. A baseline profile indicating normal behavior of the first metric is generated based on the periodicity profile. An anomaly identification module selectively identifies an anomaly in present values of the first metric in response to the present values deviating outside the baseline profile.


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