The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Mar. 07, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Adi Dagan, Kiryat Motzkin, IL;

Avishai Fedida, Haifa, IL;

Olaf K. Hendrickson, Rochester, MN (US);

Oz Hershkovitz, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06F 11/2236 (2013.01);
Abstract

A method and apparatus are provided for implementing random content of program loops in random test generation for processor verification. A converged branch instruction stream is used by a test generator to ensure that all random conditional branches converge to a main program loop. A built in exception handling mechanism of the test generator enables program interrupts to converge to the main program loop. Mandatory read only registers applied to the test generator allow all register based storage addresses to use registers that maintain a value and thus stabilize the storage address translations through subsequent iterations of the loop. A global class restriction mechanism defines specific restricted instruction classes applied to the test generator avoids inherently problematic operations for the program loops. Machine state detection and restoration mechanisms in the test generator are provided to preserve storage addressability.


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