The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Jul. 29, 2016
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventor:

Ankur Agrawal, Bangalore, IN;

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/00 (2006.01); G06F 1/32 (2006.01); G06F 3/06 (2006.01); G06F 13/40 (2006.01); G06F 13/42 (2006.01); G06F 1/26 (2006.01); G11C 5/14 (2006.01); G11C 7/20 (2006.01); G11C 16/30 (2006.01); G11C 29/02 (2006.01); G11C 7/24 (2006.01);
U.S. Cl.
CPC ...
G06F 1/3287 (2013.01); G06F 1/266 (2013.01); G06F 1/3275 (2013.01); G06F 3/0604 (2013.01); G06F 3/0625 (2013.01); G06F 3/0634 (2013.01); G06F 3/0679 (2013.01); G06F 13/4068 (2013.01); G06F 13/4282 (2013.01); G11C 5/148 (2013.01); G11C 7/20 (2013.01); G11C 16/30 (2013.01); G11C 29/021 (2013.01); G06F 2213/0042 (2013.01); G11C 5/14 (2013.01); G11C 7/24 (2013.01);
Abstract

A system and method is disclosed for an electronic device, such as a non-volatile memory associated with a host, to determine a current sourcing capability of the host and to adjust performance characteristics of the electronic device based on the determined current sourcing capability. The system may include an input current source testing circuit, device function circuitry and a controller configured to determine a current sourcing capability of a host with the input current source testing circuit, select a device performance parameter associated with the determined current sourcing capability and operate the device function circuitry according to the device performance parameter until detecting a power-off event. The method may include the electronic device reducing a resistance presented to the host to a plurality of predetermined resistance levels to determine the current sourcing capability of the host and utilizing the results of the determination to select associated device performance parameters.


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