The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Aug. 13, 2015
Applicant:

Fisher-rosemount Systems, Inc., Round Rock, TX (US);

Inventors:

Wilhelm K. Wojsznis, Austin, TX (US);

Terrence L. Blevins, Round Rock, TX (US);

Mark J. Nixon, Round Rock, TX (US);

John M. Caldwell, Austin, TX (US);

Assignee:

FISHER-ROSEMOUNT SYSTEMS, INC., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/042 (2006.01); G05B 13/04 (2006.01); G05B 17/02 (2006.01);
U.S. Cl.
CPC ...
G05B 19/0423 (2013.01); G05B 13/048 (2013.01); G05B 17/02 (2013.01); G05B 2219/23292 (2013.01); G05B 2219/24075 (2013.01); G05B 2219/31121 (2013.01); G05B 2219/33192 (2013.01); G05B 2219/42058 (2013.01);
Abstract

A multiple-input/multiple-output control routine in the form of a model predictive control (MPC) routine operates with wireless or other sensors that provide non-periodic, intermittent or otherwise delayed process variable measurement signals at an effective rate that is slower than the MPC controller scan or execution rate. The wireless MPC routine operates normally even when the measurement scan period for the controlled process variables is significantly larger than the operational scan period of the MPC controller routine, while providing control signals that enable control of the process in a robust and acceptable manner. During operation, the MPC routine uses an internal process model to simulate one or more measured process parameter values without performing model bias correction during the scan periods at which no new process parameter measurements are transmitted to the controller. When a new measurement for a particular process variable is available at the controller, the model prediction and simulated parameter values are updated with model bias correction based on the new measurement value, according to traditional MPC techniques.


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