The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Jul. 07, 2015
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Nobuyuki Watanabe, Kanagawa, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/36 (2006.01); G02B 21/24 (2006.01); G02B 21/26 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/06 (2013.01); G02B 21/241 (2013.01); G02B 21/26 (2013.01); G02B 21/362 (2013.01); G02B 21/367 (2013.01);
Abstract

An imaging apparatus includes: a stage; an imaging unit having an imaging surface for receiving observation light from an object on the stage; a first moving mechanism for performing a relative movement between the stage and the imaging unit along at least one direction within a placement plane for placing the object; a second moving mechanism for performing a relative movement between the stage and the imaging unit along a direction orthogonal to the placement plane; a computation unit that causes the imaging unit to image a first region of the object while operating the first moving mechanism to acquire information on the first region, and calculates a focus tendency of the object; and a control unit that controls the second moving mechanism based on the focus tendency, and adjusts an imaging characteristic of the observation light when the imaging unit images a second region of the object.


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