The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Jun. 29, 2009
Applicants:

Jim A. Grau, Marshfield, MA (US);

Markus Berheide, Medford, MA (US);

Christian Stoller, Princeton Junction, NJ (US);

Brad Roscoe, West Chesterfield, NH (US);

James Thornton, East Windsor, NJ (US);

Inventors:

Jim A. Grau, Marshfield, MA (US);

Markus Berheide, Medford, MA (US);

Christian Stoller, Princeton Junction, NJ (US);

Brad Roscoe, West Chesterfield, NH (US);

James Thornton, East Windsor, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/08 (2006.01); G01V 5/10 (2006.01);
U.S. Cl.
CPC ...
G01V 5/104 (2013.01);
Abstract

Systems and methods for estimating absolute elemental concentrations of a subterranean formation from neutron-induced gamma-ray spectroscopy are provided. In one example, a system for estimating an absolute yield of an element in a subterranean formation may include a downhole tool and data processing circuitry. The downhole tool may include a neutron source to emit neutrons into the formation, a neutron monitor to detect a count rate of the emitted neutrons, and a gamma-ray detector to obtain gamma-ray spectra deriving at least in part from inelastic gamma-rays produced by inelastic scattering events and neutron capture gamma-rays produced by neutron capture events. The data processing circuitry may be configured to determine a relative elemental yield from the gamma-ray spectra and to determine an absolute elemental yield based at least in part on a normalization of the relative elemental yield to the count rate of the emitted neutrons.


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